Available tools
Advanced Microscopy Facility (AMF)
- Hitachi S-4800 field emission scanning electron microscope (FESEM) with BSD and EDX ()
- Hitachi FB-2100 focused ion beam (FIB) with W deposition and nanomanipulator ()
- Hitachi H-7000 transmission electron microscope (TEM) with digital imaging ()
- HF-3300V scanning transmission electron holography microscope (STEHM) with aberration correction, EELS/EFTEM, EDX, holography and tomography ()
- Sample preparation (C and Au/Pd coating, ion milling, UV and plasma cleaning, cryo-plunge)
Facility for Imaging, Photonics and Spectroscopy (FIPS)
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- Scanning near-field optical microscopy (SNOM) (coming soon)
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- Tip-enhanced Raman scattering (TERS) microscope ()
- Transmission optical microscope (a few are available)
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Nanofabrication Facility (Nanofab)
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